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Abe, Shinichiro; Liao, W.*; Manabe, Seiya*; Sato, Tatsuhiko; Hashimoto, Masanori*; Watanabe, Yukinobu*
IEEE Transactions on Nuclear Science, 66(7, Part 2 ), p.1374 - 1380, 2019/07
Times Cited Count：7 Percentile：61.94(Engineering, Electrical & Electronic)Single event upsets (SEUs) caused by secondary cosmic-ray neutrons have recognized as a serious reliability problem for microelectronic devices. Acceleration tests at neutron facilities are convenient to validate soft error rates (SERs) quickly, but some corrections caused from measurement conditions are required to derive realistic SERs at actual environment or to compare other measured data. In this study, the effect of irradiation side on neutron-induced SEU cross sections was investigated by performing neutron transport simulation using PHITS. SERs for 65-nm bulk CMOS SRAMs are estimated using the sensitive volume model. It was found from simulation that SERs for the sealant side irradiation are 30-50% larger than those for the board side irradiation. This difference comes from the difference of production yield and angular distribution of secondary H and He ions, which are the main cause of SEUs. Thus the direction of neutron irradiation should be reported when the result of acceleration tests are published. This result also indicates that SERs can be reduced by equipping device with sealant side facing downward.
Manabe, Seiya*; Watanabe, Yukinobu*; Liao, W.*; Hashimoto, Masanori*; Nakano, Keita*; Sato, Hikaru*; Kin, Tadahiro*; Abe, Shinichiro; Hamada, Koji*; Tampo, Motonobu*; et al.
IEEE Transactions on Nuclear Science, 65(8), p.1742 - 1749, 2018/08
Times Cited Count：8 Percentile：62.99(Engineering, Electrical & Electronic)Recently, the malfunction of microelectronics caused by secondary cosmic-ray muon is concerned as semiconductor devices become sensitive to radiation. In this study, we have performed muon irradiation testing for 65-nm ultra-thin body and thin buried oxide (UTBB-SOI) SRAMs in the Japan Proton Accelerator Research Complex (J-PARC), in order to investigate dependencies of single event upset (SEU) cross section on incident muon momentum and supply voltage. It was found that the SEU cross section by negative muon are approximately two to four times larger than those by positive muon in the momentum range from 35 MeV/c to 39 MeV/c. The supply voltage dependence of muon-induced SEU cross section was measured with the momentum of 38 MeV/c. SEU cross sections decrease with increasing supply voltage, but the decreasing of SEU cross section by negative muon is gentler than that by positive muon. Experimental data of positive and negative muon irradiation with the momentum of 38 MeV/c were analyzed by PHITS. It was clarified that the negative muon capture causes the difference between the SEU cross section by negative muon and that by positive muon.
Laird, J. S.; Hirao, Toshio; Onoda, Shinobu; Wakasa, Takeshi; Yamakawa, Takeshi; Abe, Hiroshi; Oyama, Hidenori*; Kamiya, Tomihiro
JAERI-Review 2004-025, TIARA Annual Report 2003, p.14 - 16, 2004/11
no abstracts in English
Hirao, Toshio; Laird, J. S.; Onoda, Shinobu; Wakasa, Takeshi; Ito, Hisayoshi
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.187 - 189, 2004/10
no abstracts in English
Kamiya, Tomihiro; Hirao, Toshio; Kobayashi, Yasuhiko
Nuclear Instruments and Methods in Physics Research B, 219-220, p.1010 - 1014, 2004/06
Times Cited Count：8 Percentile：48.81(Instruments & Instrumentation)no abstracts in English
Yokota, Wataru; Arakawa, Kazuo; Okumura, Susumu; Fukuda, Mitsuhiro; Kamiya, Tomihiro; Nakamura, Yoshiteru
Proceedings of 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Application, p.179 - 184, 2000/10
no abstracts in English
Nashiyama, Isamu; Matsuda, Sumio*
Hoshasen To Sangyo, (79), p.10 - 15, 1998/00
no abstracts in English
Nashiyama, Isamu
Materiaru Raifu, 9(2), p.69 - 72, 1997/04
no abstracts in English
Nashiyama, Isamu; Hirao, Toshio; Ito, Hisayoshi; Oshima, Takeshi
JAERI-Conf 97-003, p.22 - 25, 1997/03
no abstracts in English
Kamiya, Tomihiro; Suda, Tamotsu*; Tanaka, Ryuichi
Nuclear Instruments and Methods in Physics Research B, 118(1-4), p.447 - 450, 1996/09
Times Cited Count：34 Percentile：92(Instruments & Instrumentation)no abstracts in English
Nashiyama, Isamu; Hirao, Toshio; Ito, Hisayoshi; Kamiya, Tomihiro; Naito, Ichiro*; Matsuda, Sumio*
Proceedings of 3rd European Conference on Radiations and their Effects on Components and Systems (RADECS 95), p.94 - 100, 1995/09
no abstracts in English
Kamiya, Tomihiro
Radioisotopes, 44(8), p.570 - 590, 1995/08
no abstracts in English
Kamiya, Tomihiro; ; Suda, Tamotsu*; *
BEAMS 1995: Dai-6-Kai Ryushisen No Sentanteki Oyo Gijutsu Ni Kansuru Shimpojiumu Koen Rombunshu, 0, p.127 - 130, 1995/00
no abstracts in English
Tanaka, Ryuichi; Kamiya, Tomihiro
Nuclear Instruments and Methods in Physics Research B, 79(1), p.432 - 435, 1993/07
Times Cited Count：7 Percentile：61.32(Instruments & Instrumentation)no abstracts in English
Kamiya, Tomihiro; Yuto, Hidenori; Tanaka, Ryuichi
Dai-5-Kai Tandemu Kasokuki Oyobi Sono Shuhen Gijutsu No Kenkyukai Hokokushu, p.116 - 119, 1992/07
no abstracts in English
Kamiya, Tomihiro; *; Tanaka, Ryuichi
Dai-3-Kai Ryushisen No Sentanteki Oyo Gijutsu Ni Kansuru Shimpojiumu, p.453 - 456, 1992/00
no abstracts in English
Kamiya, Tomihiro; *; Minehara, Eisuke; Tanaka, Ryuichi; Odomari, Iwao*
Nuclear Instruments and Methods in Physics Research B, 64, p.362 - 366, 1992/00
Times Cited Count：30 Percentile：91.05(Instruments & Instrumentation)no abstracts in English
Kamiya, Tomihiro; *; Tanaka, Ryuichi
Proc. of the lst Meeting on the Ion Engineering Society of Japan, p.105 - 110, 1992/00
no abstracts in English
Kamiya, Tomihiro; *; Tanaka, Ryuichi
Proceedings of the International Workshop on Radiation Effects of Semiconductor Devices for Space Application, p.112 - 117, 1992/00
no abstracts in English
Utsunomiya, Nobuhiro; Kamiya, Tomihiro; Tanaka, Ryuichi; Minehara, Eisuke
Dai-3-Kai Tandemu Kasokuki Oyobi Sono Shuhen Gijutsu No Kenkyukai Hokokushu, p.86 - 89, 1990/07
no abstracts in English
Yokota, Wataru; Ono, Yutaka; Makino, Takahiro
no journal, ,
no abstracts in English
